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Secondary Ion Mass Spectrometry

Secondary Ion Mass Spectrometry PDF
Author: Robert G. Wilson
Publisher: Wiley-Interscience
ISBN:
Size: 15.73 MB
Format: PDF, ePub, Mobi
Category : Science
Languages : en
Pages : 384
View: 5398

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Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) A. Benninghoven, F. G. Rüdenauer, and H. W. Werner "[This book] is (and probably will be for a long time ahead) the standard book on secondary ion mass spectrometry." —Trends in Analytical Chemistry "This is a monumental work, and contains nearly 600 illustrations and over 2,000 references covering nearly all the essential published information up to 1985. The book will certainly find its place as a reference work in most laboratories using this methodology" —Analytica Chimica Acta 1987 (0 471-01056-1) 1,227 pp. Secondary Ion Mass Spectrometry Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI) Edited by A. Benninghoven, A.M. Huber, and H. W. Werner "The international SIMS conferences have been held every two years since 1977. They are recognized as one of the major forums for scientists, instrument manufacturers, and other researchers actively engaged in this rapidly expanding field…this volume is a valuable account of the latest advances in the field of SIMS, and of the research trends of some of the most respected experts in the field.…it is recommended for the libraries of all academic and industrial institutions where SIMS research is ongoing.…it should prove a valuable reference source for years to come." —Applied Spectroscopy 1988 (0 471-91832-6) 1,078 pp.

Secondary Ion Mass Spectroscopy Of Solid Surfaces

Secondary Ion Mass Spectroscopy of Solid Surfaces PDF
Author: V. T. Cherepin
Publisher: CRC Press
ISBN: 1466563737
Size: 30.64 MB
Format: PDF, Kindle
Category : Science
Languages : en
Pages : 138
View: 546

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This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis.

Secondary Ion Mass Spectrometry Sims Viii

Secondary Ion Mass Spectrometry SIMS VIII PDF
Author: A. Benninghoven
Publisher: John Wiley & Sons Incorporated
ISBN:
Size: 65.39 MB
Format: PDF, Mobi
Category : Science
Languages : en
Pages : 917
View: 773

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The proceedings of the Eighth International Conference on Secondary Ion Mass Spectrometry was held in Amsterdam, September 15-20, 1991. Contains over 200 contributions by international experts in their respective fields regarding the recent progress in analytical applications, instrument development and understanding the secondary ion formation and emission processes. Coverage includes techniques for extremely sensitive quantitative element analysis with high lateral and depth resolution, increasing SIMS application to molecular and, in particular, organic materials and much more.

Cluster Secondary Ion Mass Spectrometry

Cluster Secondary Ion Mass Spectrometry PDF
Author: Christine M. Mahoney
Publisher: John Wiley & Sons
ISBN: 1118589246
Size: 57.30 MB
Format: PDF, ePub, Docs
Category : Science
Languages : en
Pages : 352
View: 1902

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Explores the impact of the latest breakthroughs in clusterSIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatialresolution imaging mass spectrometry technique, which can be usedto characterize the three-dimensional chemical structure in complexorganic and molecular systems. It works by using a cluster ionsource to sputter desorb material from a solid sample surface.Prior to the advent of the cluster source, SIMS was severelylimited in its ability to characterize soft samples as a result ofdamage from the atomic source. Molecular samples were essentiallydestroyed during analysis, limiting the method's sensitivity andprecluding compositional depth profiling. The use of new andemerging cluster ion beam technologies has all but eliminated theselimitations, enabling researchers to enter into new fields onceconsidered unattainable by the SIMS method. With contributions from leading mass spectrometry researchersaround the world, Cluster Secondary Ion Mass Spectrometry:Principles and Applications describes the latest breakthroughsin instrumentation, and addresses best practices in cluster SIMSanalysis. It serves as a compendium of knowledge on organic andpolymeric surface and in-depth characterization using cluster ionbeams. It covers topics ranging from the fundamentals and theory ofcluster SIMS, to the important chemistries behind the success ofthe technique, as well as the wide-ranging applications of thetechnology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ionbeams Specialty applications ranging from biological samples analysisto semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging frombeginning to advanced in level, with plenty of figures to helpbetter understand complex concepts and processes. In addition, eachchapter ends with a detailed reference set to the primaryliterature, facilitating further research into individual topicswhere desired. Cluster Secondary Ion Mass Spectrometry:Principles and Applications is a must-have read for anyresearcher in the surface analysis and/or imaging mass spectrometryfields.

Secondary Ion Mass Spectrometry Sims Iii

Secondary Ion Mass Spectrometry SIMS III PDF
Author: A. Benninghoven
Publisher: Springer
ISBN:
Size: 62.43 MB
Format: PDF, Docs
Category : Science
Languages : en
Pages : 444
View: 2222

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Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981. The Conference was attended by about 250 participants. The success of the 1981 Conference in Budapest was especially due to the excellent preparation and organization by the Local Organizing Committee. We would also like to acknowledge the generous hospitality and cooperation of the Hungarian Academy of Sciences. Japan was chosen to be the location for the next conference in 1983. SIMS conferences are devoted to two main issues: improving the application of SIMS in different and especially new fields, and understanding the ion formation process. Needless to say, there is a very strong interaction be tween these two issues. The major reason for the rapid increase in SIMS activities in the last few years is the fact that SIMS is a powerful tool for bulk, thin-film, and surface analysis. Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.

Secondary Ion Mass Spectrometry Sims Iv

Secondary Ion Mass Spectrometry SIMS IV PDF
Author: A. Benninghoven
Publisher: Springer Science & Business Media
ISBN: 3642822568
Size: 27.50 MB
Format: PDF
Category : Science
Languages : en
Pages : 506
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This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hotel, Osaka, Japan, from November 13th to 19th, 1983. Coordinated by a local or ganizing committee under the auspices of the international organizing com mittee, it followed earlier conferences held in MUnster (1977), Stanford (1979), and Budapest (1981). The conference was attended by about 250 participants from 18 countries, and 130 papers including 24 invited ones were presented. Reflecting the rap idly expanding activities in the SIMS field, informative papers were pre sented containing up-to-date information on SIMS and various related fields. The proceedings focussed upon six main issues: (1) Fundamentals of sput tering and secondary ion formation. (2) Recent progress in instrumentation, including submicron SIMS and image processing. (3) SIMS combined with other surface analysis techniques. (4) Outstanding SIMS-related analytical methods such as laser-microprobe SIMS, sputtered neutral mass spectrometry, mass spectrometry of sputtered neutrals by multi-photon resonance ionization, and accelerator-based SIMS. (5) Organic SIMS and FAB which has recently become a rapidly expanding technique in pharmacy, biotechnology, etc. (6) Appl ica tions of SIMS to various fields such as metallurgy, geology, and biology, including depth profiling of semiconductors, and analysis of inorganic mate rials. As a venue for the exchange of ideas and information concerning all the above issues, the conference proved a great success.

Secondary Ion Mass Spectrometry

Secondary Ion Mass Spectrometry PDF
Author: F. A. Stevie
Publisher:
ISBN: 9781606505885
Size: 40.23 MB
Format: PDF, ePub, Docs
Category : Technology & Engineering
Languages : en
Pages : 262
View: 4596

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Secondary ion mass spectroscopy is a technology used primarily to determine the surface chemistry and structure of any particular material. It is a crucial analytical tool in determining the quality and integrity of everything from semiconductor electronics materials to films and coatings used in all sorts of materials and products. It is especially useful in studying the surface characteristics of materials, as well as chemical surface adsorption and oxidative processes. This new book will bring the reader quickly up to speed on the essential principles of this technology, the latest equipment and instrumentation developments, the newest trends in measurement and analysis, and the many new applications that are being found for this type of spectrometry. Additional reading will be provided for further study.

Secondary Ion Mass Spectrometry

Secondary Ion Mass Spectrometry PDF
Author: Paul van der Heide
Publisher: John Wiley & Sons
ISBN: 1118916778
Size: 36.26 MB
Format: PDF
Category : Science
Languages : en
Pages : 384
View: 4963

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Serves as a practical reference for those involved in Secondary IonMass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields(Chemistry, Physics, Geology and Biology) to it is applied using upto date illustrations • Introduces the accepted fundamentals and pertinentmodels associated with elemental and molecular sputtering and ionemission • Covers the theory and modes of operation of theinstrumentation used in the various forms of SIMS (Static vsDynamic vs Cluster ion SIMS) • Details how data collection/processing can be carriedout, with an emphasis placed on how to recognize and avoid commonlyoccurring analysis induced distortions • Presented as concisely as believed possible with Allsections prepared such that they can be read independently of eachother

Secondary Ion Mass Spectrometry

Secondary Ion Mass Spectrometry PDF
Author: Director of Surface Analysis Research Centre and Reader in Chemistry John C Vickerman
Publisher: Oxford University Press, USA
ISBN:
Size: 22.92 MB
Format: PDF, Mobi
Category : Science
Languages : en
Pages : 341
View: 6247

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This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.